The Graduate School Intelligent Methods for Test and Reliability (GS-IMTR) at the University of Stuttgart is funded by Advantest, one of the world leaders in Automated Test Equipment. It bundles the wide competencies of different institutes at the University’s Faculty for Computer Science, Electrical Engineering and Information Technology, and it is also open for other Faculties. Around ten PhD candidates and one Junior Professor will work together towards new solutions. The Graduate School’s scope includes topics such as design for test and diagnosis; post-silicon validation; test generation and optimization; robust device tuning; system-level test; lifetime test and reliability management; and test automation. A modern understanding of these topics demands novel artificial intelligence methods and has tight connections to data science, data analytics, data understanding, visualization, security, and privacy.
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dut-5-01
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: b715de5ef4f16e5da38c4df0dfe962dc
dut-5-02
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: a25ed4b2745c0893360a3c5f53acb5e1
dut-5-03
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 58.0 MB - MD5: 180db22f2fb609c050d88ae05d8a44fe
dut-5-04
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: 08282c4d8abdd570931595cca3109ff6
dut-5-05
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: 9d4c30c5b82c377922674a66c5cdbb2a
dut-5-06
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: bcc12abcc06d57326b0f2043fa9e3ce3
dut-5-07
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: 26a0eab7fa58128d36a8ea022a530d52
dut-5-08
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.7 MB - MD5: 293d1a617ff5945bc547610ee89238e7
dut-5-09
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: 0cc78ae63273f8341853bf12c8dbaed3
dut-5-10
Aug 5, 2026 - Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology
Plain Text - 71.6 MB - MD5: 7f6618501d49c4646d73f56fbef30a04
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