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Aug 5, 2026
Strobel, Tim, 2026, "Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology", https://doi.org/10.18419/DARUS-5866, DaRUS, V1
This dataset provides electrical characterization measurements of ten ring oscillator devices under test (DUT), implemented in 22nm fully depleted silicon-on-insulator (FDSOI) technology. All measurements were performed using an Advantest V93000 automated test equipment (ATE) under systematically varied supply voltage and body bias conditions. For... |
