1 to 2 of 2 Results
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 2.0 KB - 5 Variables, 40 Observations - UNF:6:cRjRYcQJ5P15e0UrqOfolg==
CRC histogram |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 76.5 KB - 7 Variables, 1000 Observations - UNF:6:jFNTZ1JIPizZtuMXXMCU1w==
Threshold identification; linesVariable Name:
Variable Name: CRC threshhold
Variable Label:
Variable Label: CRC threshhold
|