71 to 80 of 518 Results
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 5.8 KB - 6 Variables, 100 Observations - UNF:6:C6Nggrcr+wFYMdMZpDbelQ==
Two-colour ionisation rate for different wavelengths, inlcuding STD errors |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 1.9 MB - 3 Variables, 55793 Observations - UNF:6:IRCNK4MP+AYO/cvoKvnBHg==
Photo ionisation rate calculated by theory |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 9.9 KB - 19 Variables, 40 Observations - UNF:6:NOgV0crQ1LIkIWABx5xPmg==
Compairison of spin coherence using different DD sequences |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 2.0 KB - 5 Variables, 40 Observations - UNF:6:cRjRYcQJ5P15e0UrqOfolg==
CRC histogram |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 5.0 KB - 5 Variables, 105 Observations - UNF:6:0DuuGAarW9dMi2WrzAHW6A==
SSR historgam |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 1.0 KB - 3 Variables, 40 Observations - UNF:6:Ww4RojZLyUJVKAb5fPjIdQ==
Threshold identification; histogram |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 76.5 KB - 7 Variables, 1000 Observations - UNF:6:jFNTZ1JIPizZtuMXXMCU1w==
Threshold identification; lines |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 777 B - 5 Variables, 36 Observations - UNF:6:pZ0potAsA9qpdbDQsg0w4w==
U-I-curve in bulk also with negative bias |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 4.9 MB - 1001 Variables, 1000 Observations - UNF:6:re2z2V2yEFL3S3ptiO7Dew==
Full confocal map showing area of depletion zone statistics, WG's and location of defect-1 & defect-2 |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 350.3 KB - 625 Variables, 141 Observations - UNF:6:QTVpsy/iBiqiwKSm5dk5rw==
Stark tuning of PLE in WG |
