3rd Physics Institute

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61 to 70 of 482 Results

FigS2c.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 8.2 KB - 19 Variables, 24 Observations - UNF:6:AiaqRITGRJ27Ik64K9W5/g== Depletion zone mapping using PLE linewidth of V2's
FigS2d_add.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 1.1 MB - 7 Variables, 9967 Observations - UNF:6:45O0IDIRRbPgt19NtTdnOA== Simulated depletion zone for different emitter depths
FigS2d.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 8.2 KB - 19 Variables, 24 Observations - UNF:6:AiaqRITGRJ27Ik64K9W5/g== Depletion zone mapping using PLE linewidth of V2's
FigS2e1.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 113.4 MB - 3001 Variables, 3000 Observations - UNF:6:ZWM1VjUpq0HgTcUt/oUTVw==
FigS2e2.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 107.5 MB - 3001 Variables, 3000 Observations - UNF:6:65dZxdvU5NjT6WLykzq/iA==
FigS2e3.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 109.2 MB - 3001 Variables, 3000 Observations - UNF:6:YFwamy6QKFUJADmrr8IwNA==
FigS2e4.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 106.5 MB - 3001 Variables, 3000 Observations - UNF:6:HEb/EaI09W5o1Zu1ts6Egw==
FigS3_LC.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations - UNF:6:FAy6CHLpP3lnBG4lflk/jQ== Confocal difference of 0V and +25V
FigS3_LL.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations - UNF:6:I7qkwMUb2PDJsnfhxazQGg== Confocal difference of 0V and -150V
FigS3_LR.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations - UNF:6:HPxC0WXVuKGEnvaS/tJumQ== Confocal difference of -150V and +25V

FigS2c.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 8.2 KB - 19 Variables, 24 Observations -

Depletion zone mapping using PLE linewidth of V2's

FigS2d_add.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 1.1 MB - 7 Variables, 9967 Observations -

Simulated depletion zone for different emitter depths

FigS2d.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 8.2 KB - 19 Variables, 24 Observations -

Depletion zone mapping using PLE linewidth of V2's

FigS2e1.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 113.4 MB - 3001 Variables, 3000 Observations -

FigS2e2.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 107.5 MB - 3001 Variables, 3000 Observations -

FigS2e3.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 109.2 MB - 3001 Variables, 3000 Observations -

FigS2e4.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 106.5 MB - 3001 Variables, 3000 Observations -

FigS3_LC.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations -

Confocal difference of 0V and +25V

FigS3_LL.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations -

Confocal difference of 0V and -150V

FigS3_LR.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations -

Confocal difference of -150V and +25V

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