3rd Physics Institute

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51 to 60 of 454 Results

FigS4f.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 47.4 KB - 248 Variables, 30 Observations - UNF:6:2B/IMjM/PocsQjCUjY9I4g== Examplary PLE with Stark Tuning in SIL
FigS4g.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 1.3 KB - 4 Variables, 30 Observations - UNF:6:cF7Icm978mlg0SAAIb4IOQ== Detuning and depletion versus bias voltage
FigS4h.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 7.9 KB - 7 Variables, 101 Observations - UNF:6:4QTUqvmzFxpSMY0x0atK9g== ODMR measurement on different PLE transitions
FigS4i.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 7.2 KB - 11 Variables, 40 Observations - UNF:6:Q5PlvqjC+t8qXFXiT49XlA== Rescale coherence time measurements using different DD sequences
FigS4j.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 744 B - 7 Variables, 10 Observations - UNF:6:+v4WvokfxHo+fO9k1O8jYA== Prolonged coherence time versus # of used DD pulses
FigS5b_lower.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 1.1 MB - 500 Variables, 500 Observations - UNF:6:N7PMX1AftEaf2yIQ3lSbmw== EL confocal
FigS5b_upper.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 1.4 MB - 500 Variables, 500 Observations - UNF:6:3MvinQFIhyZ2dEfeb0ZFvw== PL confocal
FigS5c.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 1.0 KB - 5 Variables, 40 Observations - UNF:6:Y8ac0Jd7ms6Y3xshxvSZBA== U-I-curve in forward and backward direction up to high current
FigS5d.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 4.7 KB - 5 Variables, 100 Observations - UNF:6:b5Bhs1xr/+Iq4dSaQ8TPxg== Electroluminescence versus current
FigS5e.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 44.9 KB - 5 Variables, 1043 Observations - UNF:6:SDhjcKyMNCRcj3zJwlPmeQ== EL spectra

FigS4f.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 47.4 KB - 248 Variables, 30 Observations -

Examplary PLE with Stark Tuning in SIL

FigS4g.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 1.3 KB - 4 Variables, 30 Observations -

Detuning and depletion versus bias voltage

FigS4h.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 7.9 KB - 7 Variables, 101 Observations -

ODMR measurement on different PLE transitions

FigS4i.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 7.2 KB - 11 Variables, 40 Observations -

Rescale coherence time measurements using different DD sequences

FigS4j.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 744 B - 7 Variables, 10 Observations -

Prolonged coherence time versus # of used DD pulses

FigS5b_lower.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 1.1 MB - 500 Variables, 500 Observations -

EL confocal

FigS5b_upper.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 1.4 MB - 500 Variables, 500 Observations -

PL confocal

FigS5c.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 1.0 KB - 5 Variables, 40 Observations -

U-I-curve in forward and backward direction up to high current

FigS5d.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 4.7 KB - 5 Variables, 100 Observations -

Electroluminescence versus current

FigS5e.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 44.9 KB - 5 Variables, 1043 Observations -

EL spectra

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