51 to 60 of 510 Results
Sep 5, 2025 -
Replication Data for: Modeling Quantum Volume Using Randomized Benchmarking of Room-Temperature NV Center Quantum Registers
Tabular Data - 5.6 KB - 1 Variables, 201 Observations - UNF:6:VTTmWYOvwW3UHWMrygaCkg==
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Sep 3, 2025 -
Replication Data for: "Efficient detection of statistical RF fields with a quantum sensor"
Tabular Data - 11.1 KB - 2 Variables, 306 Observations - UNF:6:lpXZcCobJJqZHjWq8KA0MA==
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Sep 3, 2025 -
Replication Data for: "Efficient detection of statistical RF fields with a quantum sensor"
Tabular Data - 227.3 KB - 4 Variables, 4000 Observations - UNF:6:Sdy6wlZOS3Pw0hYblPTOpg==
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Sep 3, 2025 -
Replication Data for: "Efficient detection of statistical RF fields with a quantum sensor"
Tabular Data - 2.3 KB - 4 Variables, 49 Observations - UNF:6:CS6IL5sAi7nrGSP5QlKaTg==
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Sep 3, 2025 -
Replication Data for: "Efficient detection of statistical RF fields with a quantum sensor"
Tabular Data - 676 B - 2 Variables, 25 Observations - UNF:6:i85lsQf4PM81f5/y7NTv2A==
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Sep 3, 2025 -
Replication Data for: "Efficient detection of statistical RF fields with a quantum sensor"
Tabular Data - 8.2 MB - 7 Variables, 99990 Observations - UNF:6:OtKZ4RrSzhmoDl+g5fs0bQ==
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May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 79.2 KB - 271 Variables, 60 Observations - UNF:6:6hrxRRBvAx9cQ6woy9U4Jg==
Location of used defects in the study using confocal microscopy |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 8.2 KB - 19 Variables, 24 Observations - UNF:6:AiaqRITGRJ27Ik64K9W5/g==
Depletion zone mapping using PLE linewidths |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 338.1 KB - 401 Variables, 120 Observations - UNF:6:h6grSmpXPhuQYm0W3YZcbA==
PLE measurements of V2 coupled to charge trap and manipulation of its charge state using bias |
May 21, 2025 -
Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'
Tabular Data - 67.0 KB - 101 Variables, 60 Observations - UNF:6:GfY6V/aCPAVFcWgjzKWSAA==
PLE measurements of V2 coupled to charge trap and manipulation of its charge state using only PLE lasers |
