3rd Physics Institute

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41 to 50 of 454 Results

FigS3_LL.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations - UNF:6:I7qkwMUb2PDJsnfhxazQGg== Confocal difference of 0V and -150V
FigS3_LR.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations - UNF:6:HPxC0WXVuKGEnvaS/tJumQ== Confocal difference of -150V and +25V
FigS3_UC.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 5.0 MB - 1001 Variables, 1000 Observations - UNF:6:SBaEyvNn04EZNe3sA/Mdhg== Confocal 0V
FigS3_UL.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 5.0 MB - 1001 Variables, 1000 Observations - UNF:6:UesviPlQu7+VHQsZ10HSLw== Confocal -150V
FigS3_UR.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 5.0 MB - 1001 Variables, 1000 Observations - UNF:6:NFw8LF+yyDV73txfhuFeFg== Confocal +25V
FigS4a.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 511.7 KB - 301 Variables, 300 Observations - UNF:6:6nsAMt0lxwAYSAlKoolWsQ== Confocal all SILs
FigS4b.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 225.3 KB - 189 Variables, 200 Observations - UNF:6:UXrl556qWDnTPDpn/CUWcA== Confocal SIL A
FigS4c.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 88.7 KB - 121 Variables, 120 Observations - UNF:6:OlqbI5zq+72k+gDklllvkA== Confocal SIL E
FigS4d.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 453.4 KB - 259 Variables, 300 Observations - UNF:6:DHgGu6OZFuxalnH8GDS+3g== Confocal SIL H
FigS4e.tab May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' Tabular Data - 1.8 KB - 7 Variables, 52 Observations - UNF:6:E+9A44kldG3WJqsAJ5tSRQ== U-I-curve of SIL sample

FigS3_LL.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations -

Confocal difference of 0V and -150V

FigS3_LR.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 18.4 MB - 1001 Variables, 1000 Observations -

Confocal difference of -150V and +25V

FigS3_UC.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 5.0 MB - 1001 Variables, 1000 Observations -

Confocal 0V

FigS3_UL.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 5.0 MB - 1001 Variables, 1000 Observations -

Confocal -150V

FigS3_UR.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 5.0 MB - 1001 Variables, 1000 Observations -

Confocal +25V

FigS4a.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 511.7 KB - 301 Variables, 300 Observations -

Confocal all SILs

FigS4b.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 225.3 KB - 189 Variables, 200 Observations -

Confocal SIL A

FigS4c.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 88.7 KB - 121 Variables, 120 Observations -

Confocal SIL E

FigS4d.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 453.4 KB - 259 Variables, 300 Observations -

Confocal SIL H

FigS4e.tab

May 21, 2025 - Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature'

Tabular Data - 1.8 KB - 7 Variables, 52 Observations -

U-I-curve of SIL sample

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