Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties" (ICPSR doi:10.18419/darus-1399)

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Part 1: Document Description
Part 2: Study Description
Part 3: Data Files Description
Part 4: Variable Description
Part 5: Other Study-Related Materials
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Document Description

Citation

Title:

Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"

Identification Number:

doi:10.18419/darus-1399

Distributor:

DaRUS

Date of Distribution:

2021-04-15

Version:

1

Bibliographic Citation:

Kousik, Shravan R., 2021, "Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"", https://doi.org/10.18419/darus-1399, DaRUS, V1, UNF:6:hD14tiP+DJV00NtMt0Oifw== [fileUNF]

Study Description

Citation

Title:

Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"

Identification Number:

doi:10.18419/darus-1399

Authoring Entity:

Kousik, Shravan R. (Universität Stuttgart)

Grant Number:

358283783 - SFB 1333

Distributor:

DaRUS

Access Authority:

Atanasova, Petia

Depositor:

Kousik, Shravan R.

Date of Deposit:

2021-02-18

Study Scope

Keywords:

Chemistry, ZnO Inverse Opals, Mesoporous materials, Diffusion in pores, Fluorescence correlation spectroscopy

Abstract:

This paper describes the synthesis and characterization of macro-mesoporous ZnO inverse opals through a template-based approach. In addition, the distribution and diffusion of a fluorescent organic tracer molecule (Alexa Fluor 488) through quasi-mesoporous ZnO inverse opals was investigated via confocal laser scanning microscopy (CLSM) and fluorescence correlation spectroscopy (FCS). The attached data consists of relevant scanning electron microscope (SEM) images, particle and pore-size distributions, film thickness data, X-ray diffraction (XRD) patterns, ultraviolet-visible (UV-Vis) spectra, CLSM images and FCS spectra. The following data formats are used: *tif, *.png, *.xlsx and *.xy. The data files are ordered as per their appearance in the publication.

Methodology and Processing

Sources Statement

Data Access

Notes:

CC BY Waiver

Other Study Description Materials

Related Publications

Citation

Identification Number:

10.3390/nano11010196

Bibliographic Citation:

Kousik, S.R.; Sipp, D.; Abitaev, K.; Li, Y.; Sottmann, T.; Koynov, K.; Atanasova, P. From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties. Nanomaterials 2021, 11, 196.

File Description--f57094

File: Fig.5 - XRD-ZnO-standard-ICSD-34477.tab

  • Number of cases: 610

  • No. of variables per record: 2

  • Type of File: text/tab-separated-values

Notes:

UNF:6:ql29qEJxzRubiF1/QtpxFw==

File Description--f57092

File: Fig.6b - UV.tab

  • Number of cases: 601

  • No. of variables per record: 3

  • Type of File: text/tab-separated-values

Notes:

UNF:6:/NFn0B05nmZPM9s5Bc7Lzg==

File Description--f57270

File: Fig.7b - Alexa 488 above ZnO-IO.tab

  • Number of cases: 140

  • No. of variables per record: 4

  • Type of File: text/tab-separated-values

Notes:

UNF:6:lJb8IHkW5SV7jNqn12nIIg==

File Description--f57269

File: Fig.7b - Alexa 488 in ZnO-IO.tab

  • Number of cases: 184

  • No. of variables per record: 4

  • Type of File: text/tab-separated-values

Notes:

UNF:6:ob6K7jQnrr6aW5TR9SKJ1Q==

File Description--f57095

File: Fig.S5b.tab

  • Number of cases: 61

  • No. of variables per record: 2

  • Type of File: text/tab-separated-values

Notes:

UNF:6:ibqdnsc9L03zuhyujGZlsw==

Variable Description

List of Variables:

Variables

2-Theta

f57094 Location:

Summary Statistics: StDev 17.623611056383048; Max. 80.9; Valid 610.0; Mean 50.45; Min. 20.0

Variable Format: numeric

Notes: UNF:6:eYqTM0IUaKBui1aY/pKZnw==

Intensity

f57094 Location:

Summary Statistics: StDev 701.547768415919; Mean 132.11967213114758; Valid 610.0; Max. 9074.0; Min. 0.0

Variable Format: numeric

Notes: UNF:6:6f/fYpHr73C0+PdEki2UBQ==

Wavelength (nm)

f57092 Location:

Summary Statistics: Mean 500.0; StDev 173.63803346809323; Valid 601.0; Min. 200.0; Max. 800.0;

Variable Format: numeric

Notes: UNF:6:HxcXsODgybUEvSM9ihthIw==

% Reflectance (5c ZnO-extraction)

f57092 Location:

Summary Statistics: Valid 601.0; Max. 50.68594; Mean 24.42033414309484; StDev 10.603105275921198; Min. 3.7148

Variable Format: numeric

Notes: UNF:6:OpuXX6Rur2NsPMbyCiYKDg==

% Reflectance (5c ZnO-calcination)

f57092 Location:

Summary Statistics: Mean 17.717648103161395; Max. 22.4576; Min. 4.3534; Valid 601.0; StDev 6.169102040687992

Variable Format: numeric

Notes: UNF:6:WRjv9Q1EwY5NiKxuT8xSfw==

Lag Time (s)

f57270 Location:

Summary Statistics: Mean 0.018724477142857146; Valid 140.0; Min. 1.0E-6; Max. 0.20972; StDev 0.042142965628585466

Variable Format: numeric

Notes: UNF:6:7sKGK7LMGQNysGXp2uEv1w==

Correlation

f57270 Location:

Summary Statistics: Mean 0.2604147804285714; Valid 140.0; StDev 0.3503621338263489; Max. 1.04875; Min. -0.00129;

Variable Format: numeric

Notes: UNF:6:Kbs1qQrEpk/EU1nDFu3ucA==

Lag Time Fit (s)

f57270 Location:

Summary Statistics: Min. 1.0E-6; Mean 0.018724477142857146; Max. 0.20972; StDev 0.042142965628585466; Valid 140.0;

Variable Format: numeric

Notes: UNF:6:7sKGK7LMGQNysGXp2uEv1w==

Correlation Fit

f57270 Location:

Summary Statistics: Mean 0.2577848527857142; Valid 140.0; Max. 0.9894; StDev 0.34448994844325065; Min. 9.79E-6

Variable Format: numeric

Notes: UNF:6:B3tE1EagE2OrDpz2a8HzFg==

Lag Time (s)

f57269 Location:

Summary Statistics: StDev 1.2029355997817777; Min. 2.0E-7; Valid 184.0; Mean 0.455902547826087; Max. 6.71089;

Variable Format: numeric

Notes: UNF:6:eu+4kpuv+RspjdoN5oQlSA==

Correlation

f57269 Location:

Summary Statistics: Mean 0.34788187499999995; Min. -0.00326; StDev 0.33491498720041524; Max. 1.24427; Valid 184.0

Variable Format: numeric

Notes: UNF:6:Xl4tdK1zIh8g1Fxb3M66Ng==

Lag Time Fit (s)

f57269 Location:

Variable Format: character

Notes: UNF:6:+ce67cnscg4zdnAMzP1FWg==

Correlation Fit

f57269 Location:

Variable Format: character

Notes: UNF:6:rLZbnolC3YGFy8PajN5aPw==

Position Z (µm)

f57095 Location:

Summary Statistics: Valid 61.0; Mean 8.860000000000003; Min. -6.14; StDev 8.876467014903321; Max. 23.86

Variable Format: numeric

Notes: UNF:6:uC66RkjiJECaYVeZAdvjWg==

Count rate (kHz)

f57095 Location:

Summary Statistics: Mean 1.5989; Max. 4.198; Valid 61.0; Min. 1.1156; StDev 0.5572549850233136;

Variable Format: numeric

Notes: UNF:6:fd9F5wm5tgFD64erQ2rD5g==

Other Study-Related Materials

Label:

Fig.1b - PS template 175 nm.tif

Text:

SEM - PS175-T (175 nm PS particles)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1c - PS template 70 nm.tif

Text:

SEM - PS70-T (70 nm PS particles)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1d - PS template 60 nm.tif

Text:

SEM - PS60-T (60 nm PS particles)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1e - PS template 48 nm.tif

Text:

SEM - PS48-T (48 nm PS particles)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1f - ZnO inverse opal 131 nm.tif

Text:

SEM - Z175-IO (ZnO inverse opals with pore size : 131 nm)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1g - ZnO inverse opal 60 nm.tif

Text:

SEM - Z70-IO (ZnO inverse opals with pore size : 60 nm)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1h - ZnO inverse opal 50 nm.tif

Text:

SEM - Z60-IO (ZnO inverse opals with pore size : 50 nm)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.1i - ZnO inverse opal Z48-IO.tif

Text:

SEM - Z48-IO (ZnO inverse opals)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.2a-d - PS particle and inverse opal pore size distributions.xlsx

Text:

Average diameters, standard deviations and polydispersities of PS particles and the pores of their corresponding ZnO inverse opals

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.3a - ZnO inverse opal with 60 nm PS template.tif

Text:

SEM - Z60-IO (ZnO inverse opals obtained from 60 nm PS particles) - Infiltration depth

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.3b - ZnO inverse opal with 175 nm PS template.tif

Text:

Cross-section SEM - Z175-IO (ZnO inverse opals obtained from 175 nm PS particles)

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4a - PS template 70 nm.tif

Text:

Cross-section SEM - PS70-T

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4b - ZnO inverse opal-calcined.tif

Text:

Cross-section SEM - Z70-IO - Calcined

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4c - ZnO inverse opal-solvent extraction.tif

Text:

Cross-section SEM - Z70-IO - Extracted

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4d - ZnO inverse opal-calcinated-additional 1 cycle ZnO.tif

Text:

Cross-section SEM - Z70-IO - Calcined - 1 additional ZnO deposition cycle

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4e - ZnO inverse opal-solvent extraction-additional 1 cycle ZnO.tif

Text:

Cross-section SEM - Z70-IO - Extracted - 1 additional ZnO deposition cycle

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4f - ZnO inverse opal-calcined-additional 2 cycles ZnO.tif

Text:

Cross-section SEM - Z70-IO - Calcined - 2 additional ZnO deposition cycles

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.4g - ZnO inverse opal-solvent extraction-additional 2 cycles ZnO.tif

Text:

Cross-section SEM - Z70-IO - Extracted - 2 additional ZnO deposition cycles

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.5 - XRD-ZnO-5c-175nm-Calcined.xy

Text:

Raw data - XRD - Z175-IO after calcination

Notes:

application/octet-stream

Other Study-Related Materials

Label:

Fig.5 - XRD-ZnO-5c-175nm-Extracted.xy

Text:

Raw data - XRD - Z175-IO - After Extraction

Notes:

application/octet-stream

Other Study-Related Materials

Label:

Fig.5 - XRD-ZnO-standard-ICSD-34477.xlsx

Text:

Raw data - XRD - ZnO - ICSD number : 34477

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.6a - PS template 175 nm.tif

Text:

SEM image of PS template with diameter 175 nm

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.6b - UV.xlsx

Text:

Raw data for UV-Vis spectra of Z175-IO obtained after extraction and calcination

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.6c - UV.xlsx

Text:

Raw data for UV-Vis spectra of Z175-IO obtained after extraction measured at different angles of incidence

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.7a - Image 19 3D.png

Text:

CLSM image of multilayered ZnO inverse opals with a pore size of 60 nm infiltrated with Alexa Fluor 488

Notes:

image/png

Other Study-Related Materials

Label:

Fig.7b - Alexa 488 above ZnO-IO.xlsx

Text:

Normalized autocorrelation function for Alexa Fluor 488 diffusing in water

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.7b - Alexa 488 in ZnO-IO.xlsx

Text:

Normalized autocorrelation function for Alexa Fluor 488 diffusing in ZnO-IO

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.S1a - PS 60 nm.xlsx

Text:

Thickness of 60 nm PS template films

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.S1b - PS 70 nm.xlsx

Text:

Thickness of 70 nm PS template films

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.S1c - PS 175 nm.xlsx

Text:

Thickness of 175 nm PS template films

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Fig.S2 - 175 nm PS template film - crack formation.tif

Text:

Cross-section SEM - PS175-T

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.S3a - ZnO-IO pore size 131 nm 3 cycles ZnO-calcined.tif

Text:

Cross-section SEM image of Z175-IO after 3 mineralization cycles followed by calcination

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.S3b - ZnO-IO pore size 131 nm 3 cycles ZnO-solvent extraction.tif

Text:

Cross-section SEM image of Z175-IO after 3 mineralization cycles followed by extraction

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.S4a - ZnO-IO pore size 50 nm-calcined.tif

Text:

Cross-section SEM image of Z60-IO after 3 mineralization cycles followed by calcination

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.S5a - Multilayered ZnO-IO pore size 60 nm.tif

Text:

Cross-section SEM - Multilayered ZnO IO for CLSM

Notes:

image/tiff

Other Study-Related Materials

Label:

Fig.S5b.xlsx

Text:

Raw data - Fluorescence intensity scan through ZnO IO film immersed in Alexa Fluor 488 in a direction normal to the film plane

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet

Other Study-Related Materials

Label:

Table 2 - PS particles and ZnO IO pore size statistics.xlsx

Text:

Average diameters, standard deviations and polydispersities of PS particles and the pores of their corresponding ZnO inverse opals

Notes:

application/vnd.openxmlformats-officedocument.spreadsheetml.sheet