Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties" (doi:10.18419/darus-1399)

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Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"

doi:10.18419/darus-1399

DaRUS

2021-04-15

1

Kousik, Shravan R., 2021, "Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"", https://doi.org/10.18419/darus-1399, DaRUS, V1, UNF:6:hD14tiP+DJV00NtMt0Oifw== [fileUNF]

Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"

doi:10.18419/darus-1399

Kousik, Shravan R. (Universität Stuttgart)

358283783 - SFB 1333

DaRUS

Atanasova, Petia

Kousik, Shravan R.

2021-02-18

https://doi.org/10.18419/darus-1399

Chemistry, ZnO Inverse Opals, Mesoporous materials, Diffusion in pores, Fluorescence correlation spectroscopy

This paper describes the synthesis and characterization of macro-mesoporous ZnO inverse opals through a template-based approach. In addition, the distribution and diffusion of a fluorescent organic tracer molecule (Alexa Fluor 488) through quasi-mesoporous ZnO inverse opals was investigated via confocal laser scanning microscopy (CLSM) and fluorescence correlation spectroscopy (FCS). The attached data consists of relevant scanning electron microscope (SEM) images, particle and pore-size distributions, film thickness data, X-ray diffraction (XRD) patterns, ultraviolet-visible (UV-Vis) spectra, CLSM images and FCS spectra. The following data formats are used: *tif, *.png, *.xlsx and *.xy. The data files are ordered as per their appearance in the publication.

Kousik, S.R.; Sipp, D.; Abitaev, K.; Li, Y.; Sottmann, T.; Koynov, K.; Atanasova, P. From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties. Nanomaterials 2021, 11, 196.

10.3390/nano11010196

Kousik, S.R.; Sipp, D.; Abitaev, K.; Li, Y.; Sottmann, T.; Koynov, K.; Atanasova, P. From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties. Nanomaterials 2021, 11, 196.

• Number of cases: 140

• No. of variables per record: 4

• Type of File: text/tab-separated-values

UNF:6:lJb8IHkW5SV7jNqn12nIIg==

• Number of cases: 184

• No. of variables per record: 4

• Type of File: text/tab-separated-values

UNF:6:ob6K7jQnrr6aW5TR9SKJ1Q==

• Number of cases: 61

• No. of variables per record: 2

• Type of File: text/tab-separated-values

UNF:6:ibqdnsc9L03zuhyujGZlsw==

• Number of cases: 601

• No. of variables per record: 3

• Type of File: text/tab-separated-values

UNF:6:/NFn0B05nmZPM9s5Bc7Lzg==

• Number of cases: 610

• No. of variables per record: 2

• Type of File: text/tab-separated-values

UNF:6:ql29qEJxzRubiF1/QtpxFw==

• Lag Time (s) - Lag Time (s)
• Correlation - Correlation
• Lag Time Fit (s) - Lag Time Fit (s)
• Correlation Fit - Correlation Fit
• Lag Time (s) - Lag Time (s)
• Correlation - Correlation
• Lag Time Fit (s) - Lag Time Fit (s)
• Correlation Fit - Correlation Fit
• Position Z (µm) - Position Z (µm)
• Count rate (kHz) - Count rate (kHz)
• Wavelength (nm) - Wavelength (nm)
• % Reflectance (5c ZnO-extraction) - % Reflectance (5c ZnO-extraction)
• % Reflectance (5c ZnO-calcination) - % Reflectance (5c ZnO-calcination)
• 2-Theta - 2-Theta
• Intensity - Intensity

f57270 Location:

Summary Statistics: StDev 0.042142965628585466; Max. 0.20972; Min. 1.0E-6; Valid 140.0; Mean 0.018724477142857146

Variable Format: numeric

Notes: UNF:6:7sKGK7LMGQNysGXp2uEv1w==

f57270 Location:

Summary Statistics: Min. -0.00129; Max. 1.04875; StDev 0.3503621338263489; Valid 140.0; Mean 0.2604147804285714

Variable Format: numeric

Notes: UNF:6:Kbs1qQrEpk/EU1nDFu3ucA==

f57270 Location:

Summary Statistics: Valid 140.0; StDev 0.042142965628585466; Max. 0.20972; Mean 0.018724477142857146; Min. 1.0E-6

Variable Format: numeric

Notes: UNF:6:7sKGK7LMGQNysGXp2uEv1w==

f57270 Location:

Summary Statistics: Min. 9.79E-6; StDev 0.34448994844325065; Max. 0.9894; Valid 140.0; Mean 0.2577848527857142;

Variable Format: numeric

Notes: UNF:6:B3tE1EagE2OrDpz2a8HzFg==

f57269 Location:

Summary Statistics: Max. 6.71089; Mean 0.455902547826087; Valid 184.0; Min. 2.0E-7; StDev 1.2029355997817777

Variable Format: numeric

Notes: UNF:6:eu+4kpuv+RspjdoN5oQlSA==

f57269 Location:

Summary Statistics: Valid 184.0; Max. 1.24427; StDev 0.33491498720041524; Min. -0.00326; Mean 0.34788187499999995

Variable Format: numeric

Notes: UNF:6:Xl4tdK1zIh8g1Fxb3M66Ng==

f57269 Location:

Variable Format: character

Notes: UNF:6:+ce67cnscg4zdnAMzP1FWg==

f57269 Location:

Variable Format: character

Notes: UNF:6:rLZbnolC3YGFy8PajN5aPw==

f57095 Location:

Summary Statistics: Max. 23.86; StDev 8.876467014903321; Min. -6.14; Mean 8.860000000000003; Valid 61.0;

Variable Format: numeric

Notes: UNF:6:uC66RkjiJECaYVeZAdvjWg==

f57095 Location:

Summary Statistics: StDev 0.5572549850233136; Min. 1.1156; Valid 61.0; Max. 4.198; Mean 1.5989;

Variable Format: numeric

Notes: UNF:6:fd9F5wm5tgFD64erQ2rD5g==

f57092 Location:

Summary Statistics: Max. 800.0; Min. 200.0; Valid 601.0; StDev 173.63803346809323; Mean 500.0

Variable Format: numeric

Notes: UNF:6:HxcXsODgybUEvSM9ihthIw==

f57092 Location:

Summary Statistics: Min. 3.7148; StDev 10.603105275921198; Mean 24.42033414309484; Max. 50.68594; Valid 601.0;

Variable Format: numeric

Notes: UNF:6:OpuXX6Rur2NsPMbyCiYKDg==

f57092 Location:

Summary Statistics: StDev 6.169102040687992; Valid 601.0; Min. 4.3534; Max. 22.4576; Mean 17.717648103161395;

Variable Format: numeric

Notes: UNF:6:WRjv9Q1EwY5NiKxuT8xSfw==

f57094 Location:

Summary Statistics: Min. 20.0; Mean 50.45; Valid 610.0; Max. 80.9; StDev 17.623611056383048;

Variable Format: numeric

Notes: UNF:6:eYqTM0IUaKBui1aY/pKZnw==

f57094 Location:

Summary Statistics: Min. 0.0; Max. 9074.0; Valid 610.0; Mean 132.11967213114758; StDev 701.547768415919

Variable Format: numeric

Notes: UNF:6:6f/fYpHr73C0+PdEki2UBQ==

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Fig.7a - Image 19 3D.png

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CLSM image of multilayered ZnO inverse opals with a pore size of 60 nm infiltrated with Alexa Fluor 488

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Fig.7b - Alexa 488 above ZnO-IO.xlsx

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Normalized autocorrelation function for Alexa Fluor 488 diffusing in water

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Fig.7b - Alexa 488 in ZnO-IO.xlsx

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Normalized autocorrelation function for Alexa Fluor 488 diffusing in ZnO-IO

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Fig.S5b.xlsx

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Raw data - Fluorescence intensity scan through ZnO IO film immersed in Alexa Fluor 488 in a direction normal to the film plane

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Fig.S1a - PS 60 nm.xlsx

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Thickness of 60 nm PS template films

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Fig.S1b - PS 70 nm.xlsx

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Thickness of 70 nm PS template films

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Fig.S1c - PS 175 nm.xlsx

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Thickness of 175 nm PS template films

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Fig.2a-d - PS particle and inverse opal pore size distributions.xlsx

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Average diameters, standard deviations and polydispersities of PS particles and the pores of their corresponding ZnO inverse opals

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Table 2 - PS particles and ZnO IO pore size statistics.xlsx

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Average diameters, standard deviations and polydispersities of PS particles and the pores of their corresponding ZnO inverse opals

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Fig.1b - PS template 175 nm.tif

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SEM - PS175-T (175 nm PS particles)

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Fig.1c - PS template 70 nm.tif

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SEM - PS70-T (70 nm PS particles)

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Fig.1d - PS template 60 nm.tif

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SEM - PS60-T (60 nm PS particles)

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Fig.1e - PS template 48 nm.tif

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SEM - PS48-T (48 nm PS particles)

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Fig.1f - ZnO inverse opal 131 nm.tif

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SEM - Z175-IO (ZnO inverse opals with pore size : 131 nm)

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Fig.1g - ZnO inverse opal 60 nm.tif

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SEM - Z70-IO (ZnO inverse opals with pore size : 60 nm)

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Fig.1h - ZnO inverse opal 50 nm.tif

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SEM - Z60-IO (ZnO inverse opals with pore size : 50 nm)

image/tiff

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Fig.1i - ZnO inverse opal Z48-IO.tif

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SEM - Z48-IO (ZnO inverse opals)

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Fig.3a - ZnO inverse opal with 60 nm PS template.tif

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SEM - Z60-IO (ZnO inverse opals obtained from 60 nm PS particles) - Infiltration depth

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Fig.3b - ZnO inverse opal with 175 nm PS template.tif

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Cross-section SEM - Z175-IO (ZnO inverse opals obtained from 175 nm PS particles)

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Fig.4a - PS template 70 nm.tif

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Cross-section SEM - PS70-T

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Fig.4b - ZnO inverse opal-calcined.tif

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Cross-section SEM - Z70-IO - Calcined

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Fig.4c - ZnO inverse opal-solvent extraction.tif

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Cross-section SEM - Z70-IO - Extracted

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Fig.4d - ZnO inverse opal-calcinated-additional 1 cycle ZnO.tif

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Cross-section SEM - Z70-IO - Calcined - 1 additional ZnO deposition cycle

image/tiff

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Fig.4e - ZnO inverse opal-solvent extraction-additional 1 cycle ZnO.tif

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Cross-section SEM - Z70-IO - Extracted - 1 additional ZnO deposition cycle

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Fig.4f - ZnO inverse opal-calcined-additional 2 cycles ZnO.tif

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Cross-section SEM - Z70-IO - Calcined - 2 additional ZnO deposition cycles

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Fig.4g - ZnO inverse opal-solvent extraction-additional 2 cycles ZnO.tif

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Cross-section SEM - Z70-IO - Extracted - 2 additional ZnO deposition cycles

image/tiff

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Fig.6a - PS template 175 nm.tif

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SEM image of PS template with diameter 175 nm

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Fig.S2 - 175 nm PS template film - crack formation.tif

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Cross-section SEM - PS175-T

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Fig.S3a - ZnO-IO pore size 131 nm 3 cycles ZnO-calcined.tif

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Cross-section SEM image of Z175-IO after 3 mineralization cycles followed by calcination

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Fig.S3b - ZnO-IO pore size 131 nm 3 cycles ZnO-solvent extraction.tif

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Cross-section SEM image of Z175-IO after 3 mineralization cycles followed by extraction

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Fig.S4a - ZnO-IO pore size 50 nm-calcined.tif

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Cross-section SEM image of Z60-IO after 3 mineralization cycles followed by calcination

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Fig.S5a - Multilayered ZnO-IO pore size 60 nm.tif

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Cross-section SEM - Multilayered ZnO IO for CLSM

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Fig.6b - UV.xlsx

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Raw data for UV-Vis spectra of Z175-IO obtained after extraction and calcination

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Fig.6c - UV.xlsx

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Raw data for UV-Vis spectra of Z175-IO obtained after extraction measured at different angles of incidence

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Fig.5 - XRD-ZnO-5c-175nm-Calcined.xy

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Raw data - XRD - Z175-IO after calcination

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Fig.5 - XRD-ZnO-5c-175nm-Extracted.xy

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Raw data - XRD - Z175-IO - After Extraction

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Fig.5 - XRD-ZnO-standard-ICSD-34477.xlsx

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Raw data - XRD - ZnO - ICSD number : 34477

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