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Part 1: Document Description
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Citation |
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Title: |
Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties" |
Identification Number: |
doi:10.18419/darus-1399 |
Distributor: |
DaRUS |
Date of Distribution: |
2021-04-15 |
Version: |
1 |
Bibliographic Citation: |
Kousik, Shravan R., 2021, "Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties"", https://doi.org/10.18419/darus-1399, DaRUS, V1, UNF:6:hD14tiP+DJV00NtMt0Oifw== [fileUNF] |
Citation |
|
Title: |
Publication data for: "From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties" |
Identification Number: |
doi:10.18419/darus-1399 |
Authoring Entity: |
Kousik, Shravan R. (Universität Stuttgart) |
Grant Number: |
358283783 - SFB 1333 |
Distributor: |
DaRUS |
Access Authority: |
Atanasova, Petia |
Depositor: |
Kousik, Shravan R. |
Date of Deposit: |
2021-02-18 |
Holdings Information: |
https://doi.org/10.18419/darus-1399 |
Study Scope |
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Keywords: |
Chemistry, ZnO Inverse Opals, Mesoporous materials, Diffusion in pores, Fluorescence correlation spectroscopy |
Abstract: |
This paper describes the synthesis and characterization of macro-mesoporous ZnO inverse opals through a template-based approach. In addition, the distribution and diffusion of a fluorescent organic tracer molecule (Alexa Fluor 488) through quasi-mesoporous ZnO inverse opals was investigated via confocal laser scanning microscopy (CLSM) and fluorescence correlation spectroscopy (FCS). The attached data consists of relevant scanning electron microscope (SEM) images, particle and pore-size distributions, film thickness data, X-ray diffraction (XRD) patterns, ultraviolet-visible (UV-Vis) spectra, CLSM images and FCS spectra. The following data formats are used: *tif, *.png, *.xlsx and *.xy. The data files are ordered as per their appearance in the publication. |
Methodology and Processing |
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Sources Statement |
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Data Access |
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Other Study Description Materials |
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Related Publications |
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Citation |
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Identification Number: |
10.3390/nano11010196 |
Bibliographic Citation: |
Kousik, S.R.; Sipp, D.; Abitaev, K.; Li, Y.; Sottmann, T.; Koynov, K.; Atanasova, P. From Macro to Mesoporous ZnO Inverse Opals: Synthesis, Characterization and Tracer Diffusion Properties. Nanomaterials 2021, 11, 196. |
File Description--f57094 |
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File: Fig.5 - XRD-ZnO-standard-ICSD-34477.tab |
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Notes: |
UNF:6:ql29qEJxzRubiF1/QtpxFw== |
File Description--f57092 |
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File: Fig.6b - UV.tab |
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Notes: |
UNF:6:/NFn0B05nmZPM9s5Bc7Lzg== |
File Description--f57270 |
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File: Fig.7b - Alexa 488 above ZnO-IO.tab |
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Notes: |
UNF:6:lJb8IHkW5SV7jNqn12nIIg== |
File Description--f57269 |
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File: Fig.7b - Alexa 488 in ZnO-IO.tab |
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Notes: |
UNF:6:ob6K7jQnrr6aW5TR9SKJ1Q== |
File Description--f57095 |
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File: Fig.S5b.tab |
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Notes: |
UNF:6:ibqdnsc9L03zuhyujGZlsw== |
List of Variables: |
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Variables |
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f57094 Location: |
Summary Statistics: Min. 20.0; Mean 50.45; Valid 610.0; Max. 80.9; StDev 17.623611056383048; Variable Format: numeric Notes: UNF:6:eYqTM0IUaKBui1aY/pKZnw== |
f57094 Location: |
Summary Statistics: Min. 0.0; Max. 9074.0; Valid 610.0; Mean 132.11967213114758; StDev 701.547768415919 Variable Format: numeric Notes: UNF:6:6f/fYpHr73C0+PdEki2UBQ== |
f57092 Location: |
Summary Statistics: Max. 800.0; Min. 200.0; Valid 601.0; StDev 173.63803346809323; Mean 500.0 Variable Format: numeric Notes: UNF:6:HxcXsODgybUEvSM9ihthIw== |
f57092 Location: |
Summary Statistics: Min. 3.7148; StDev 10.603105275921198; Mean 24.42033414309484; Max. 50.68594; Valid 601.0; Variable Format: numeric Notes: UNF:6:OpuXX6Rur2NsPMbyCiYKDg== |
f57092 Location: |
Summary Statistics: StDev 6.169102040687992; Valid 601.0; Min. 4.3534; Max. 22.4576; Mean 17.717648103161395; Variable Format: numeric Notes: UNF:6:WRjv9Q1EwY5NiKxuT8xSfw== |
f57270 Location: |
Summary Statistics: StDev 0.042142965628585466; Max. 0.20972; Min. 1.0E-6; Valid 140.0; Mean 0.018724477142857146 Variable Format: numeric Notes: UNF:6:7sKGK7LMGQNysGXp2uEv1w== |
f57270 Location: |
Summary Statistics: Min. -0.00129; Max. 1.04875; StDev 0.3503621338263489; Valid 140.0; Mean 0.2604147804285714 Variable Format: numeric Notes: UNF:6:Kbs1qQrEpk/EU1nDFu3ucA== |
f57270 Location: |
Summary Statistics: Valid 140.0; StDev 0.042142965628585466; Max. 0.20972; Mean 0.018724477142857146; Min. 1.0E-6 Variable Format: numeric Notes: UNF:6:7sKGK7LMGQNysGXp2uEv1w== |
f57270 Location: |
Summary Statistics: Min. 9.79E-6; StDev 0.34448994844325065; Max. 0.9894; Valid 140.0; Mean 0.2577848527857142; Variable Format: numeric Notes: UNF:6:B3tE1EagE2OrDpz2a8HzFg== |
f57269 Location: |
Summary Statistics: Max. 6.71089; Mean 0.455902547826087; Valid 184.0; Min. 2.0E-7; StDev 1.2029355997817777 Variable Format: numeric Notes: UNF:6:eu+4kpuv+RspjdoN5oQlSA== |
f57269 Location: |
Summary Statistics: Valid 184.0; Max. 1.24427; StDev 0.33491498720041524; Min. -0.00326; Mean 0.34788187499999995 Variable Format: numeric Notes: UNF:6:Xl4tdK1zIh8g1Fxb3M66Ng== |
f57269 Location: |
Variable Format: character Notes: UNF:6:+ce67cnscg4zdnAMzP1FWg== |
f57269 Location: |
Variable Format: character Notes: UNF:6:rLZbnolC3YGFy8PajN5aPw== |
f57095 Location: |
Summary Statistics: Max. 23.86; StDev 8.876467014903321; Min. -6.14; Mean 8.860000000000003; Valid 61.0; Variable Format: numeric Notes: UNF:6:uC66RkjiJECaYVeZAdvjWg== |
f57095 Location: |
Summary Statistics: StDev 0.5572549850233136; Min. 1.1156; Valid 61.0; Max. 4.198; Mean 1.5989; Variable Format: numeric Notes: UNF:6:fd9F5wm5tgFD64erQ2rD5g== |
Label: |
Fig.1b - PS template 175 nm.tif |
Text: |
SEM - PS175-T (175 nm PS particles) |
Notes: |
image/tiff |
Label: |
Fig.1c - PS template 70 nm.tif |
Text: |
SEM - PS70-T (70 nm PS particles) |
Notes: |
image/tiff |
Label: |
Fig.1d - PS template 60 nm.tif |
Text: |
SEM - PS60-T (60 nm PS particles) |
Notes: |
image/tiff |
Label: |
Fig.1e - PS template 48 nm.tif |
Text: |
SEM - PS48-T (48 nm PS particles) |
Notes: |
image/tiff |
Label: |
Fig.1f - ZnO inverse opal 131 nm.tif |
Text: |
SEM - Z175-IO (ZnO inverse opals with pore size : 131 nm) |
Notes: |
image/tiff |
Label: |
Fig.1g - ZnO inverse opal 60 nm.tif |
Text: |
SEM - Z70-IO (ZnO inverse opals with pore size : 60 nm) |
Notes: |
image/tiff |
Label: |
Fig.1h - ZnO inverse opal 50 nm.tif |
Text: |
SEM - Z60-IO (ZnO inverse opals with pore size : 50 nm) |
Notes: |
image/tiff |
Label: |
Fig.1i - ZnO inverse opal Z48-IO.tif |
Text: |
SEM - Z48-IO (ZnO inverse opals) |
Notes: |
image/tiff |
Label: |
Fig.2a-d - PS particle and inverse opal pore size distributions.xlsx |
Text: |
Average diameters, standard deviations and polydispersities of PS particles and the pores of their corresponding ZnO inverse opals |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.3a - ZnO inverse opal with 60 nm PS template.tif |
Text: |
SEM - Z60-IO (ZnO inverse opals obtained from 60 nm PS particles) - Infiltration depth |
Notes: |
image/tiff |
Label: |
Fig.3b - ZnO inverse opal with 175 nm PS template.tif |
Text: |
Cross-section SEM - Z175-IO (ZnO inverse opals obtained from 175 nm PS particles) |
Notes: |
image/tiff |
Label: |
Fig.4a - PS template 70 nm.tif |
Text: |
Cross-section SEM - PS70-T |
Notes: |
image/tiff |
Label: |
Fig.4b - ZnO inverse opal-calcined.tif |
Text: |
Cross-section SEM - Z70-IO - Calcined |
Notes: |
image/tiff |
Label: |
Fig.4c - ZnO inverse opal-solvent extraction.tif |
Text: |
Cross-section SEM - Z70-IO - Extracted |
Notes: |
image/tiff |
Label: |
Fig.4d - ZnO inverse opal-calcinated-additional 1 cycle ZnO.tif |
Text: |
Cross-section SEM - Z70-IO - Calcined - 1 additional ZnO deposition cycle |
Notes: |
image/tiff |
Label: |
Fig.4e - ZnO inverse opal-solvent extraction-additional 1 cycle ZnO.tif |
Text: |
Cross-section SEM - Z70-IO - Extracted - 1 additional ZnO deposition cycle |
Notes: |
image/tiff |
Label: |
Fig.4f - ZnO inverse opal-calcined-additional 2 cycles ZnO.tif |
Text: |
Cross-section SEM - Z70-IO - Calcined - 2 additional ZnO deposition cycles |
Notes: |
image/tiff |
Label: |
Fig.4g - ZnO inverse opal-solvent extraction-additional 2 cycles ZnO.tif |
Text: |
Cross-section SEM - Z70-IO - Extracted - 2 additional ZnO deposition cycles |
Notes: |
image/tiff |
Label: |
Fig.5 - XRD-ZnO-5c-175nm-Calcined.xy |
Text: |
Raw data - XRD - Z175-IO after calcination |
Notes: |
application/octet-stream |
Label: |
Fig.5 - XRD-ZnO-5c-175nm-Extracted.xy |
Text: |
Raw data - XRD - Z175-IO - After Extraction |
Notes: |
application/octet-stream |
Label: |
Fig.5 - XRD-ZnO-standard-ICSD-34477.xlsx |
Text: |
Raw data - XRD - ZnO - ICSD number : 34477 |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.6a - PS template 175 nm.tif |
Text: |
SEM image of PS template with diameter 175 nm |
Notes: |
image/tiff |
Label: |
Fig.6b - UV.xlsx |
Text: |
Raw data for UV-Vis spectra of Z175-IO obtained after extraction and calcination |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.6c - UV.xlsx |
Text: |
Raw data for UV-Vis spectra of Z175-IO obtained after extraction measured at different angles of incidence |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.7a - Image 19 3D.png |
Text: |
CLSM image of multilayered ZnO inverse opals with a pore size of 60 nm infiltrated with Alexa Fluor 488 |
Notes: |
image/png |
Label: |
Fig.7b - Alexa 488 above ZnO-IO.xlsx |
Text: |
Normalized autocorrelation function for Alexa Fluor 488 diffusing in water |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.7b - Alexa 488 in ZnO-IO.xlsx |
Text: |
Normalized autocorrelation function for Alexa Fluor 488 diffusing in ZnO-IO |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.S1a - PS 60 nm.xlsx |
Text: |
Thickness of 60 nm PS template films |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.S1b - PS 70 nm.xlsx |
Text: |
Thickness of 70 nm PS template films |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.S1c - PS 175 nm.xlsx |
Text: |
Thickness of 175 nm PS template films |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Fig.S2 - 175 nm PS template film - crack formation.tif |
Text: |
Cross-section SEM - PS175-T |
Notes: |
image/tiff |
Label: |
Fig.S3a - ZnO-IO pore size 131 nm 3 cycles ZnO-calcined.tif |
Text: |
Cross-section SEM image of Z175-IO after 3 mineralization cycles followed by calcination |
Notes: |
image/tiff |
Label: |
Fig.S3b - ZnO-IO pore size 131 nm 3 cycles ZnO-solvent extraction.tif |
Text: |
Cross-section SEM image of Z175-IO after 3 mineralization cycles followed by extraction |
Notes: |
image/tiff |
Label: |
Fig.S4a - ZnO-IO pore size 50 nm-calcined.tif |
Text: |
Cross-section SEM image of Z60-IO after 3 mineralization cycles followed by calcination |
Notes: |
image/tiff |
Label: |
Fig.S5a - Multilayered ZnO-IO pore size 60 nm.tif |
Text: |
Cross-section SEM - Multilayered ZnO IO for CLSM |
Notes: |
image/tiff |
Label: |
Fig.S5b.xlsx |
Text: |
Raw data - Fluorescence intensity scan through ZnO IO film immersed in Alexa Fluor 488 in a direction normal to the film plane |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
Label: |
Table 2 - PS particles and ZnO IO pore size statistics.xlsx |
Text: |
Average diameters, standard deviations and polydispersities of PS particles and the pores of their corresponding ZnO inverse opals |
Notes: |
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |